Abstract:
Thin film of 0.1HoMnO
3-0.9BiFeO
3 was deposited on flexible mica substrate by pulsed laser deposition. The crystal structure, surface appearance, bending service characteristic, ferroelectric and dielectric properties and carriage property of the film were studied. The results show that BiFeO
3 grew along the (012) and (104) crystal planes and had good crystallization. The film presented a smooth surface with root mean square surface roughness of 6.7 nm. After continuously bending and flatting for 10 000 times, the film surface showed no microcracks. The film illustrated a good micro piezoelectricity and a certain upward spontaneous polarization. The saturated and remanent polarization of the film were 68, 61
μC·cm
-2, respectively. The polarization changed little after bending to curvature radius of 2.2 mm, whereas decreased slightly after continuously bending and flatting for 10 000 times; the dielectric properties in flatting and bending states had little difference. The activation energy of the film was 0.42 eV, which was lower than that of pure BiFeO
3 film, indicating an increased carrier transport capacity.