Abstract:
Three films of TiN, Ti-Al-N and Ti-Si-N were prepared by physical vapor deposition (PVD). The influence of aluminum and silicon addition on microstructure and properties of films was studied. The results show that the Ti
3AlN phase existed preferred orientatian in microstructure of Ti-Al-N film, and a coarse columnar crystal microstructure formed. The Si
3N
4 phase formed in Ti-Si-N film, and the microstructure of Ti-Si-N film was more fine. The film base bonding force was the smallest of Ti-Al-N film and was the largest of Ti-Si-N film. The Ti-Al-N film had the smallest surface roughness and the largest hardness and elastic modulus.The friction factor of Ti-Si-N film was slightly higher than that of Ti-Al-N film, but the difference between them was small, which should be related to the fact that the microstructure of Ti-Si-N film was fine, and Si
3N
4 phase formed by Ti-Si-N film had a certain self-lubricating property.