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    与Y2O3共同掺杂下Sb2O5掺杂量对SnO2陶瓷压敏电阻电性能的影响

    Effect of Doping Amount of Sb2O5 on Electrical Properties of SnO2 Ceramic Piezoresistor Under Co-doping with Y2O3

    • 摘要: 通过在SnO2陶瓷压敏电阻中共同掺杂Sb2O5和Y2O3(0.05%,物质的量分数),采用扫描电镜和阻抗仪研究了Sb2O5掺杂量(0,0.05%,0.10%,0.15%,物质的量分数)对SnO2压敏电阻微观形貌、电压梯度和晶粒电阻的影响。结果表明:随Sb2O5掺杂量增加,SnO2压敏电阻的晶粒尺寸和界面态密度先增大后减小,电压梯度、非线性系数和泄漏电流密度先减小后增大;Sb2O5掺杂量为0.10%时,SnO2压敏电阻的界面态密度最大,泄漏电流密度最小,晶粒电阻最小,综合电性能最好。

       

      Abstract: The effect of doping amounts (0,0.05%,0.10%,0.15%, mole fraction) of Sb2O5 on the micromorphology,voltage gradient and grain resistance of SnO2 piezoresistor was studied by scanning electron microscope and impedance meter through co-doping Sb2O5 and Y2O3 (0.05%, mole fraction) into SnO2 ceramic piezoresistor. The results show that with increasing doping amount of Sb2O5, the grain size and interfacial state density of SnO2 piezoresistor increased first and then decreased, and the voltage gradient, nonlinear coefficient and leakage current density decreased first and then increased. When the doping amount of Sb2O5 was 0.10%, the interfacial state density of SnO2 piezoresistor was the largest, the leakage current density was the smallest, the grain resistance was the smallest, and the integrated electrical performance was the best.

       

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