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    鞠明, 黄坚, 吴毅雄. X射线衍射法测AM1镍基单晶合金的残余应力[J]. 机械工程材料, 2013, 37(3): 99-102.
    引用本文: 鞠明, 黄坚, 吴毅雄. X射线衍射法测AM1镍基单晶合金的残余应力[J]. 机械工程材料, 2013, 37(3): 99-102.
    JU Ming, HUANG Jian, WU Yi-xiong. XRD Measurement of Residual Stress of Nickel-Based Monocrystalline Superalloy AM1[J]. Materials and Mechanical Engineering, 2013, 37(3): 99-102.
    Citation: JU Ming, HUANG Jian, WU Yi-xiong. XRD Measurement of Residual Stress of Nickel-Based Monocrystalline Superalloy AM1[J]. Materials and Mechanical Engineering, 2013, 37(3): 99-102.

    X射线衍射法测AM1镍基单晶合金的残余应力

    XRD Measurement of Residual Stress of Nickel-Based Monocrystalline Superalloy AM1

    • 摘要: 基于Ortner方法用X射线衍射法测量了衍射峰值, 计算了AM1镍基单晶合金喷丸强化后的表面残余应力分布, 分析了衍射位置步长精度及衍射角步长精度对残余应力测量结果的影响。结果表明: 可以运用Ortner方法计算大块AM1镍基单晶合金喷丸处理后的表面残余应力; 测量至少6个晶面的晶面间距方可推导出转换矩阵G, 在测量晶面数量不小于18的情况下, 晶面数量对残余应力测试结果的影响才可以忽略; 当晶面位置参数步长精度为0.3°、衍射角的步长精度为0.01°时, 测得的应力状态基本符合喷丸处理后残余压应力的分布状态。

       

      Abstract: The surface residual stress of a shot peened nickel-based monocrystalline superalloy AM1 was calculated based on the Ortner method by measuring X-ray diffraction peaks, and effects of diffraction position step precision and diffraction angel step precision on measuring results of residual stress were analyzed. The results show that the Ortner method could be used to determine the residual stress of the shot peened chunk of nickel-based monocrystalline superalloy. A tensor matrix G could be determined by measuring the plan distance of at least 6 plans. When the diffraction position step precision was 0.3° and the diffraction angle step precision was 0.01°, the expected results of residual stress distribution after shot peening could be obtained.

       

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